France – Microscopes à sonde à balayage – Acquisition d'un module de microscopie à sonde locale (SPM)
AI summary
This tender concerns the acquisition of a scanning probe microscopy (SPM) module to be integrated into an existing Hitachi SU3800 scanning electron microscope (SEM) for samples under photonic irradiation. The module will enable advanced local probe analysis capabilities within the university's electron microscopy laboratory.
Companies specializing in scanning probe microscopy equipment, electron microscopy accessories, or scientific instrumentation manufacturers with proven experience in SEM module integration are encouraged to bid.
Suppliers must provide a compatible SPM module suitable for integration with Hitachi SU3800 SEM equipment. Technical specifications must support photonic irradiation of samples and ensure seamless compatibility with existing infrastructure.
Frequently asked questions
What is this tender about?
This tender concerns the acquisition of a scanning probe microscopy (SPM) module to be integrated into an existing Hitachi SU3800 scanning electron microscope (SEM) for samples under photonic irradiation. The module will enable advanced local probe analysis capabilities within the university's electron microscopy laboratory.
What are the requirements for suppliers?
Suppliers must provide a compatible SPM module suitable for integration with Hitachi SU3800 SEM equipment. Technical specifications must support photonic irradiation of samples and ensure seamless compatibility with existing infrastructure.
What type of company should bid?
Companies specializing in scanning probe microscopy equipment, electron microscopy accessories, or scientific instrumentation manufacturers with proven experience in SEM module integration are encouraged to bid.
Who is the buyer?
The buyer is Université d'Artois.
When does this tender close?
Submissions close on June 16, 2026.
Acquisition d'un module de microscopie à sonde locale (SPM) s'intégrant dans un microscope électronique à balayage existant (SU3800 Hitachi) pour échantillon sous irradiation photonique
Acquisition d'un module de microscopie à sonde locale (SPM)
Acquisition d'un module de microscopie à sonde locale (SPM) s'intégrant dans un microscope électronique à balayage existant (SU3800 Hitachi) pour échantillon sous irradiation photonique
- QualityDélai d'exécution4%
- QualityLes performances en matière de protection de l'environnement sont appréciées au regard du contenu du mémoire technique10%
- QualityLa valeur technique est appréciée au regard du contenu du mémoire technique56%
- PriceLe critère prix sera calculé en prenant compte le montant global des prix en Ttc30%
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